JPH058681Y2 - - Google Patents
Info
- Publication number
- JPH058681Y2 JPH058681Y2 JP1987070073U JP7007387U JPH058681Y2 JP H058681 Y2 JPH058681 Y2 JP H058681Y2 JP 1987070073 U JP1987070073 U JP 1987070073U JP 7007387 U JP7007387 U JP 7007387U JP H058681 Y2 JPH058681 Y2 JP H058681Y2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- probe card
- support
- electrical characteristics
- card board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987070073U JPH058681Y2 (en]) | 1987-05-11 | 1987-05-11 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987070073U JPH058681Y2 (en]) | 1987-05-11 | 1987-05-11 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63178327U JPS63178327U (en]) | 1988-11-18 |
JPH058681Y2 true JPH058681Y2 (en]) | 1993-03-04 |
Family
ID=30911374
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987070073U Expired - Lifetime JPH058681Y2 (en]) | 1987-05-11 | 1987-05-11 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH058681Y2 (en]) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0341467Y2 (en]) * | 1986-12-03 | 1991-08-30 | ||
JPH0766934B2 (ja) * | 1987-03-31 | 1995-07-19 | 東京エレクトロン株式会社 | プロ−ブカ−ドおよびその製造方法 |
-
1987
- 1987-05-11 JP JP1987070073U patent/JPH058681Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS63178327U (en]) | 1988-11-18 |
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